X-Ray Diffractometer w/GADDS

 

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Bruker D8  is a multi-purpose diffractometer designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi - layered thin films at ambient and non-ambient conditions.

Features:

  • Generate area detector for 2D diffraction measurements
  • Phase Identification and quantification, structure determination and refinement, microstrain and crystallite size analysis

Contact Sergi Lendinez for more information and training 

 

 

 

 

 

LSU